
Cooled Detector Fiber Optic Spectrometer with SMA905 Fiber Interface 200-1100nm Pixel Size 28.672*0.896mm
Contact Person : Phoebe Yu
Phone Number : 8618620854039
Whatsapp : +8618620854039
Minimum Order Quantity : | 1 | Price : | Negotiable |
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Packaging Details : | International Shipping Pakcage | Delivery Time : | 90-120 working days |
Payment Terms : | T/T, Western Union | Supply Ability : | 100PCS/90-120 days |
Place of Origin: | CHINA | Brand Name: | JINSP |
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Certification: | ISO9001 | Model Number: | SR100Q |
Document: | Product Brochure PDF |
Detail Information |
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Spectrual Range: | 200nm - 1100nm | Effective Pixels: | 1024*122 |
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Qutuam Efficiency: | QE92%peak@650nm, 83%@232nm | SNR: | 1000:1 |
Highlight: | 232nm Fiber Optic Spectrometer |
Product Description
Attribute | Value |
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Spectrual Range | 200nm - 1100nm |
Effective pixels | 1024*122 |
Quantum Efficiency | QE92%peak@650nm, 83%@232nm |
SNR | 1000:1 |
With applications spanning electronics, renewables, and optics, thin film technology relies heavily on precise thickness evaluation for surface analysis. Photoelectric measurement solutions stand out for being contact-free, damage-proof, and fast. The integration of intelligent computing with optical systems enhances film quality control, supporting manufacturing upgrades and technological progress.
Detector | Chip Type | Back-illuminated TE-cooled Hamamatsu S7031 |
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Effective Pixel | 1024*122 | |
Pixel Size | 24*24μm | |
Sensing Area | 24.576*2.928mm | |
Optical Parameters | ||
Optical Design | F/4 cross-type | |
Numerical Aperture | 0.13 | |
Focal Length | 100mm | |
Entrance Slit Width | 10μm,25μm,50μm,100μm,200μm (customizable) | |
Fiber Interface | SMA905,free space | |
Electrical Parameters | ||
Integration Time | 8ms-3600s | |
Data Output Interface | USB3.0,RS232,RS485,20pin connector | |
ADC Bit Depth | 16-bit | |
Power Supply | 5V | |
Operating Current | <3.5A | |
Physical Parameters | ||
Operating Temperature | 10℃~40℃ | |
Storage Temperature | -20℃~60℃ | |
Operating Humidity | <90%RH (no condensation) | |
Dimensions | 180mm*120mm*50mm | |
Weight | 1.2kg |
Model | Spectral Range(nm) | Resolution(nm) | Slit(μm) |
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SR100Q-G21 | 200~950 | 6.8 | 200 |
SR100Q-G22 | 350~1100 | 2.2 | 50 |
1.5 | 25 | ||
1.0 | 10 | ||
SR100Q-G23 | 200~775 | 1.6 | 50 |
SR100Q-G24 | 350~925 | 1.0 | 25 |
0.7 | 10 | ||
SR100Q-G25 | 532~690(4400cm-1*) | 13cm-1 | 50 |
SR100Q-G26 | 638~800(3200cm-1) | 10cm-1 | 25 |
SR100Q-G27 | 785~1050(3200cm-1) | 11cm-1 | 50 |
Note: The*are primarily designed for Raman applications, with the corresponding Raman.
A fiber-optic probe directs light toward the film, where it partially reflects at the air-film interface (first beam) and transmits through, reflecting again at the film-substrate boundary (second beam). These two beams interfere due to their path difference, generating an interference spectrum captured by the spectrometer. Thickness (d) is calculated via the extremum method using θ, n, and spectral extrema. Higher thickness increases fringe density, while longer wavelengths reduce it. Proper spectral range and resolution selection are critical for precision.
JINSP Company Limited, abbreviated as "JINSP", is a professional supplier with over 17 years of experience in spectral detection technology products, including Raman, FT-IR, LIBS technologies, etc. After 17 years of technology accumulation, the company's core key technologies have reached the international leading position at the level, and the cumulative number of patent applications exceeded 200.
In addition to its main headquarters located in the bustling city of Beijing, JINSP has established a fully owned subsidiary manufacturing facility situated in the province of Jiangsu, China.
JINSP Company received ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications. JINSP can provide required certifications, such as certification by the Ministry of Public Security or National Institute of Metrology, Environmental Level Certification, IP Level Certification, CE Certification, Transport Identification Report, EU ECAC certification, German ICT Security Testing, etc.
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