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TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectrual Range 200nm 1100nm

Minimum Order Quantity : 1 Price : Negotiable
Packaging Details : International Shipping Pakcage Delivery Time : 90-120 working days
Payment Terms : T/T, Western Union Supply Ability : 100PCS/90-120 days
Place of Origin: CHINA Brand Name: JINSP
Certification: ISO9001 Model Number: SR100Q
Document: Product Brochure PDF

Detail Information

Spectrual Range: 200nm - 1100nm Effective Pixels: 1024*122
Qutuam Efficiency: QE92%peak@650nm, 83%@232nm SNR: 1000:1
Highlight:

Non Destructive Fiber Optic Spectrometer

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1100nm Fiber Optic Spectrometer

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TE Cooled Fiber Optic Spectrometer

Product Description

TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectral Range 200nm-1100nm
Key Specifications
Spectral Range 200nm - 1100nm
Effective pixels 1024×122
Quantum Efficiency QE92% peak @650nm, 83%@232nm
SNR 1000:1
92% High Quantum Efficiency Spectrometer for Film Thickness Measurement

The widespread use of thin films in high-tech industries requires advanced thickness assessment methods. Our photoelectric technology provides non-invasive, high-efficiency measurement protocols. By combining spectral analysis with machine learning, manufacturers achieve precise control over film properties, enabling product innovation.

Product Overview

The JINSP SR100Q spectrometer integrates the Hamamatsu S7031, a scientific-grade TE-cooled area array CCD chip. With a pixel size of 24×24μm and quantum efficiency up to 92%, it delivers high response in the ultraviolet band while improving sensitivity and SNR for weak signals. The advanced high-resolution optical path and low-noise, high-speed FPGA signal processing chip ensure excellent spectrum signals and reliable performance.

Detailed Technical Specifications
Detector Specifications
Detector Chip Type Back-illuminated TE-cooled Hamamatsu S7031
Effective Pixel 1024×122
Pixel Size 24×24μm
Sensing Area 24.576×2.928mm
Optical Parameters
Optical Design F/4 cross-type
Numerical Aperture 0.13
Focal Length 100mm
Entrance Slit Width 10μm, 25μm, 50μm, 100μm, 200μm (customizable)
Fiber Interface SMA905, free space
Electrical Parameters
Integration Time 8ms-3600s
Data Output Interface USB3.0, RS232, RS485, 20pin connector
ADC Bit Depth 16-bit
Power Supply 5V
Operating Current <3.5A
Physical Parameters
Operating Temperature 10℃~40℃
Storage Temperature -20℃~60℃
Operating Humidity <90%RH (no condensation)
Dimensions 180mm×120mm×50mm
Weight 1.2kg
Product Model Variations
Model Spectral Range(nm) Resolution(nm) Slit(μm)
SR100Q-G21 200~950 6.8 200
SR100Q-G22 350~1100 2.2 50
SR100Q-G23 200~775 1.6 50
SR100Q-G24 350~925 1.0 25
SR100Q-G25 532~690(4400cm-1)* 13cm-1 50
SR100Q-G26 638~800(3200cm-1)* 10cm-1 25
SR100Q-G27 785~1050(3200cm-1)* 11cm-1 50

*Models primarily designed for Raman applications, with corresponding Raman configurations.

Technical Advantages
  • High quantum efficiency: 92% peak @650nm, 83%@232nm
  • High SNR: Ultra-low dark noise under long integration time, SNR up to 1000:1
  • Noise-free processing of weak signals during long exposure with strong environmental adaptation
  • Low-noise, high-speed circuit with USB3.0 interface
Measurement Methodology

Light transmitted via optical fiber reflects at the film's upper and lower surfaces, creating two phase-shifted beams. Their interference spectrum, recorded by the spectrometer, enables thickness calculation using the extremum method with θ, n, and peak/trough data. Thicker films increase fringe frequency, while longer wavelengths decrease it. Optimal measurement requires proper spectral range and resolution selection.

TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectrual Range 200nm 1100nm 0
Typical Applications
  • Absorption, transmittance and reflection spectrum detection
  • Light source and laser wavelength characterization
  • OEM product modules: Fluorescence spectrum, Raman spectrum, etc.
TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectrual Range 200nm 1100nm 1 TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectrual Range 200nm 1100nm 2 TE-Cooled CCD Chip Fiber Optic Spectrometer for Non-Destructive Film Thickness Measurement Spectrual Range 200nm 1100nm 3
About JINSP Company

JINSP Company Limited ("JINSP") is a professional supplier with over 17 years of experience in spectral detection technology products, including Raman, FT-IR, and LIBS technologies. After 17 years of technological development, our core technologies have reached internationally leading levels, with over 200 cumulative patent applications.

Headquartered in Beijing, JINSP operates a manufacturing facility in Jiangsu Province, China. We maintain ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications, and can provide additional certifications including:

  • Ministry of Public Security or National Institute of Metrology certification
  • Environmental Level Certification
  • IP Level Certification
  • CE Certification
  • Transport Identification Report
  • EU ECAC certification
  • German ICT Security Testing
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Frequently Asked Questions
Q1: This is my first time using this product. Is it easy to operate?
A1: We provide an English manual and instructional video to guide you through spectrometer operation. Our technicians also offer professional technical support sessions.
Q2: Do you offer operation training?
A2: Your technicians can receive training at our factory, or JINSP engineers can provide on-site support including installation, training, debugging, and maintenance.
Q3: What's your website?
A3: Visit us at: www.jinsptech.com
Q4: What about your quality assurance?
A4: Our quality inspection team thoroughly checks all goods before shipment. We can provide inspection photos upon request.

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