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Spectrual Range 200nm 1100nm Fiber Optic Spectrometer for Film Thickness Measurement in Optoelectronics and Energy Devices

Minimum Order Quantity : 1 Price : Negotiable
Packaging Details : International Shipping Pakcage Delivery Time : 90-120 working days
Payment Terms : T/T, Western Union Supply Ability : 100PCS/90-120 days
Place of Origin: CHINA Brand Name: JINSP
Certification: ISO9001 Model Number: SR100Q
Document: Product Brochure PDF

Detail Information

Spectrual Range: 200nm - 1100nm Effective Pixels: 1024*122
Qutuam Efficiency: QE92%peak@650nm, 83%@232nm SNR: 1000:1
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Optoelectronics Fiber Optic Spectrometer

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200nm 1100nm Fiber Optic Spectrometer

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Energy Devices Fiber Optic Spectrometer

Product Description

Spectrual Range 200nm-1100nm Fiber Optic Spectrometer for Film Thickness Measurement
Key Specifications
Attribute Value
Spectrual Range 200nm - 1100nm
Effective pixels 1024*122
Quantum Efficiency QE92%peak@650nm, 83%@232nm
SNR 1000:1
High Performance Spectrometer for Precision Film Thickness Measurement

As thin films become essential components in optoelectronics and energy devices, accurate thickness measurement is critical. Our photoelectric solutions provide non-contact measurement that eliminates damage risks while delivering superior precision through advanced adaptive algorithms.

Detailed Technical Parameters
Category Parameter Value
Detector Chip Type Back-illuminated TE-cooled Hamamatsu S7031
Effective Pixel 1024*122
Pixel Size 24*24μm
Sensing Area 24.576*2.928mm
Optical Parameters Optical Design F/4 cross-type
Numerical Aperture 0.13
Focal Length 100mm
Entrance Slit Width 10μm,25μm,50μm,100μm,200μm (customizable)
Fiber Interface SMA905, free space
Electrical Parameters Integration Time 8ms-3600s
Data Output Interface USB3.0, RS232, RS485, 20pin connector
ADC Bit Depth 16-bit
Power Supply 5V
Operating Current <3.5A
Physical Parameters Operating Temperature 10℃~40℃
Storage Temperature -20℃~60℃
Operating Humidity <90%RH (no condensation)
Dimensions 180mm*120mm*50mm
Weight 1.2kg
Available Models
Model Spectral Range(nm) Resolution(nm) Slit(μm)
SR100Q-G21 200~950 6.8 200
SR100Q-G22 350~1100 2.2 50
SR100Q-G23 200~775 1.6 50
SR100Q-G24 350~925 1.0 25
SR100Q-G25 532~690(4400cm-1*) 13cm-1 50
SR100Q-G26 638~800(3200cm-1*) 10cm-1 25
SR100Q-G27 785~1050(3200cm-1*) 11cm-1 50

Note: Models marked with * are primarily designed for Raman applications.

Technical Advantages
  • High quantum efficiency: 92% peak at 650nm, 83% at 232nm
  • Superior signal-to-noise ratio: Ultra-low dark noise with SNR up to 1000:1
  • Advanced signal processing: Clear detection of weak signals during long exposures with strong environmental adaptation
  • High-speed data transfer: USB3.0 interface with low-noise circuitry
Measurement Methodology

The optical fiber probe delivers light to the film, producing reflections at the air-film and film-substrate boundaries. The spectrometer captures the interference pattern formed by these beams, from which thickness (d) is derived via the extremum method (using θ, n, and spectral features). Fringe spacing varies with thickness (inversely with wavelength), necessitating tailored spectral parameters for accuracy.

Spectrual Range 200nm 1100nm Fiber Optic Spectrometer for Film Thickness Measurement in Optoelectronics and Energy Devices 0
Typical Applications
  • Absorption, transmittance and reflection spectrum analysis
  • Light source and laser wavelength characterization
  • OEM modules for fluorescence and Raman spectroscopy
Spectrual Range 200nm 1100nm Fiber Optic Spectrometer for Film Thickness Measurement in Optoelectronics and Energy Devices 1 Spectrual Range 200nm 1100nm Fiber Optic Spectrometer for Film Thickness Measurement in Optoelectronics and Energy Devices 2 Spectrual Range 200nm 1100nm Fiber Optic Spectrometer for Film Thickness Measurement in Optoelectronics and Energy Devices 3
About JINSP

JINSP Company Limited is a professional supplier with over 17 years of experience in spectral detection technology products, including Raman, FT-IR, and LIBS technologies. Our core technologies have reached internationally leading levels, with over 200 patent applications.

Headquartered in Beijing with a manufacturing facility in Jiangsu, China, JINSP holds ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications. We can provide various required certifications including CE Certification, EU ECAC certification, and German ICT Security Testing.

Frequently Asked Questions
Q1: Is this spectrometer easy to operate for first-time users?
A1: We provide comprehensive English manuals and instructional videos, along with professional technical support from our engineers.
Q2: Do you offer operation training?
A2: We provide both on-site training at our facility and can send engineers to your location for installation, training, and maintenance support.
Q3: What is your website?
A3: Visit us at www.jinsptech.com
Q4: What quality assurance do you provide?
A4: All products undergo rigorous quality inspection before shipment, with documentation and photos available upon request.

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