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SMA905 and Free Space Fiber Interface for Film Thickness Measurement with Fiber Optic Spectrometer

Minimum Order Quantity : 1 Price : Negotiable
Packaging Details : International Shipping Pakcage Delivery Time : 90-120 working days
Payment Terms : T/T, Western Union Supply Ability : 100PCS/90-120 days
Place of Origin: CHINA Brand Name: JINSP
Certification: ISO9001 Model Number: SR100Q
Document: Product Brochure PDF

Detail Information

Spectrual Range: 200nm - 1100nm Effective Pixels: 1024*122
Qutuam Efficiency: QE92%peak@650nm, 83%@232nm SNR: 1000:1
Highlight:

Film Thickness Fiber Optic Spectrometer

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Free Space Fiber Optic Spectrometer

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SMA905 Fiber Optic Spectrometer

Product Description

SMA905 and Free Space Fiber Interface for Film Thickness Measurement with Fiber Optic Spectrometer
Key Specifications
Attribute Value
Spectral Range 200nm - 1100nm
Effective pixels 1024*122
Quantum Efficiency QE92%peak@650nm, 83%@232nm
SNR 1000:1
92% High Quantum Efficiency Spectrometer for Film Thickness Measurement

From microchips to solar modules, thin film applications demand precise thickness characterization. Photoelectric measurement preserves sample integrity while delivering rapid results, making it the preferred approach for comprehensive surface analysis in precision manufacturing and next-generation material development.

The JINSP SR100Q spectrometer integrates the Hamamatsu S7031 scientific-grade TE-cooled area array CCD chip. With 24×24μm pixel size and up to 92% quantum efficiency, it delivers exceptional ultraviolet band response, enhancing sensitivity and SNR for weak signals. Advanced optical design and FPGA signal processing ensure stable, reliable performance.
Technical Parameters
Category Parameter Value
Detector Chip Type Back-illuminated TE-cooled Hamamatsu S7031
Effective Pixel 1024*122
Pixel Size 24*24μm
Sensing Area 24.576*2.928mm
Optical Parameters Optical Design F/4 cross-type
Numerical Aperture 0.13
Focal Length 100mm
Entrance Slit Width 10μm,25μm,50μm,100μm,200μm (customizable)
Fiber Interface SMA905, free space
Electrical Parameters Integration Time 8ms-3600s
Data Output Interface USB3.0, RS232, RS485, 20pin connector
ADC Bit Depth 16-bit
Power Supply 5V
Operating Current <3.5A
Physical Parameters Operating Temperature 10℃~40℃
Storage Temperature -20℃~60℃
Operating Humidity <90%RH (no condensation)
Dimensions 180mm*120mm*50mm
Weight 1.2kg
Product Models
Model Spectral Range(nm) Resolution(nm) Slit(μm)
SR100Q-G21 200~950 6.8 200
SR100Q-G22 350~1100 2.2 50
SR100Q-G23 200~775 1.6 50
SR100Q-G24 350~925 1.0 25
SR100Q-G25 532~690(4400cm-1*) 13cm-1 50
SR100Q-G26 638~800(3200cm-1*) 10cm-1 25
SR100Q-G27 785~1050(3200cm-1*) 11cm-1 50

Note: Models marked with * are primarily designed for Raman applications.

Key Technical Characteristics
  • High quantum efficiency: 92% peak @650nm, 83% @232nm
  • High SNR: Ultra-low dark noise under long integration time (1000:1 SNR)
  • Noise-free processing of weak signals in long exposure with strong environmental adaptation
  • Low-noise, high-speed circuit with USB3.0 interface
Measurement Methodology

The system employs a fiber-optic probe to illuminate the film, generating reflections at both the air-film and film-substrate interfaces. These beams interfere to form a spectrum analyzed by the spectrometer. Using the extremum method—factoring in θ, n, and spectral extrema—film thickness (d) is computed. Fringe density correlates with thickness, while wavelength inversely affects it. Careful spectral range and resolution adjustments ensure reliable results.

SMA905 and Free Space Fiber Interface for Film Thickness Measurement with Fiber Optic Spectrometer 0
Typical Applications
  • Absorption, transmittance and reflection spectrum analysis
  • Light source and laser wavelength characterization
  • OEM modules for fluorescence and Raman spectroscopy
SMA905 and Free Space Fiber Interface for Film Thickness Measurement with Fiber Optic Spectrometer 1 SMA905 and Free Space Fiber Interface for Film Thickness Measurement with Fiber Optic Spectrometer 2 SMA905 and Free Space Fiber Interface for Film Thickness Measurement with Fiber Optic Spectrometer 3
About JINSP

JINSP Company Limited is a professional supplier with over 17 years of experience in spectral detection technologies including Raman, FT-IR, and LIBS. With over 200 patent applications, our core technologies have reached international leading levels.

Headquartered in Beijing with a manufacturing facility in Jiangsu, China, JINSP holds ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications. We provide additional certifications including CE, ECAC, and various security testing reports.

Frequently Asked Questions
Q1: Is this spectrometer easy to operate for first-time users?
A1: We provide English manuals and instructional videos, along with professional technical support from our engineers.
Q2: Do you offer operator training?
A2: Training is available at our facility or we can send engineers to your location for installation, training, and maintenance.
Q3: What is your website?
A3: Visit www.jinsptech.com for more information.
Q4: What quality assurance do you provide?
A4: All products undergo rigorous quality inspection before shipment, with documentation available upon request.

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